Combined Map Display Tester

Combined Map Display Tester

Combined Map Display Tester

MS 1117

This system is used to test COMED (Combined Map Electronic Display) IFU cards. This ATE checks the LRU Status and card status and identify faulty component in the individual UUT. On fault, this suggests the possible component failure as diagnostic report, for repairing the cards.


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Features

  • Industrial PC with PCI Cards based Host System
  • Discrete Generation and Measurement Boards
  • UUT interface (ZIF connector) & Calibration facility
  • Industrial and Mil Standards Application
  • Menu driven Software, Fault diagnostic Software, Schematic driven Software
  • MIL 1553B Interface & Synchro Interface

 

Specifications

  • 19’’ Rack mountable
  • Power Supply Input: 230V AC 50Hz, 115V 400Hz
  • Operating Temperature: 0°C to 55°C
  • Storage Temperature: -25°C to +85°C
  • 90% Relative Humidity (Non-condensing)

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